Wafer bonding

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41

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Source URL: socrates.berkeley.edu

Language: English - Date: 2012-01-18 12:08:54
42PERSPECTIVES wafer bonding approach allows point defects and potentially also waveguides to be introduced parallel to the layers by proper lithography. In addition, wafer bonding can incorporate a layer that acts as a li

PERSPECTIVES wafer bonding approach allows point defects and potentially also waveguides to be introduced parallel to the layers by proper lithography. In addition, wafer bonding can incorporate a layer that acts as a li

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Source URL: zhuang.harvard.edu

Language: English - Date: 2005-11-02 16:55:06
43Microsoft Word - R. Dean CV 5_13.doc

Microsoft Word - R. Dean CV 5_13.doc

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Source URL: www.eng.auburn.edu

Language: English - Date: 2013-05-15 12:10:09
44The Advantages of Integrated MEMS to Enable the Internet of Moving Things WHITE PAPER JUNE 2014  The availability of contextual information regarding motion and direction is transforming consumer device

The Advantages of Integrated MEMS to Enable the Internet of Moving Things WHITE PAPER JUNE 2014 The availability of contextual information regarding motion and direction is transforming consumer device

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Source URL: www.mcubemems.com

Language: English - Date: 2014-06-25 02:33:18
45Microsoft PowerPoint - Sparks Microtech - Slides[removed]Compatibility Mode]

Microsoft PowerPoint - Sparks Microtech - Slides[removed]Compatibility Mode]

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Source URL: www.techconnectworld.com

Language: English - Date: 2010-06-15 12:08:49
46Ionut Radu SOITEC, Senior Expert - R&D, Bernin (France) Ionut Radu joined Soitec’s R&D organization in 2006 as staff scientist to develop wafer bonding solutions for advanced SOI substrates, such as sSOI, UTBOX and FD-

Ionut Radu SOITEC, Senior Expert - R&D, Bernin (France) Ionut Radu joined Soitec’s R&D organization in 2006 as staff scientist to develop wafer bonding solutions for advanced SOI substrates, such as sSOI, UTBOX and FD-

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Source URL: www.nanofis.net

Language: English - Date: 2014-06-12 15:59:24
47ECF15  STEADY-STATE MEASUREMENT OF THE INTERFACE FRACTURE RESISTANCE IN WAFER BONDING Y. Bertholet1,2, F. Iker1,3, X.X. Zhang1,3, J.P. Raskin1,3 and T. Pardoen1,2,* 1

ECF15 STEADY-STATE MEASUREMENT OF THE INTERFACE FRACTURE RESISTANCE IN WAFER BONDING Y. Bertholet1,2, F. Iker1,3, X.X. Zhang1,3, J.P. Raskin1,3 and T. Pardoen1,2,* 1

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Source URL: www.structuralintegrity.eu

Language: English - Date: 2009-10-23 06:25:17
48Ziptronix and Customer Pursue Lower-Cost 3D Memory With DBI® Wafer Bonding and Interconnect Technology Ability to Replace Die Stacking with High-strength Wafer Stacking Simplifies Process Flows, Increases Interconnect D

Ziptronix and Customer Pursue Lower-Cost 3D Memory With DBI® Wafer Bonding and Interconnect Technology Ability to Replace Die Stacking with High-strength Wafer Stacking Simplifies Process Flows, Increases Interconnect D

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Source URL: www.ziptronix.com

Language: English - Date: 2012-12-12 11:53:15
49Microsoft Word - Ziptronix_EVG_PR_FINAL.docx

Microsoft Word - Ziptronix_EVG_PR_FINAL.docx

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Source URL: www.ziptronix.com

Language: English - Date: 2014-05-28 10:11:14
50Microsoft Word - SF80904.FINAL.IMAPS.WLP_BalancingDevReqsnMatlsProperties.doc

Microsoft Word - SF80904.FINAL.IMAPS.WLP_BalancingDevReqsnMatlsProperties.doc

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Source URL: www.suss.com

Language: English - Date: 2012-04-27 03:43:28